EN 300019-2-2-1999 设备工程(EE).电信设备环境条件和环境试验.第2-2部分:运输环境试验规范

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【英文标准名称】:EquipmentEngineering(EE)-Environmentalconditionsandenvironmentaltestsfortelecommunicationsequipment-Part2-2:Specificationofenvironmentaltests,transportation(EndorsementoftheEnglishversionEN300019-2-2V2.1.2(1999-09)asGermanst
【原文标准名称】:设备工程(EE).电信设备环境条件和环境试验.第2-2部分:运输环境试验规范
【标准号】:EN300019-2-2-1999
【标准状态】:现行
【国别】:
【发布日期】:2000-05
【实施或试行日期】:
【发布单位】:欧洲标准学会(EN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:环境影响;电气工程;气候试验;仪器;运输;环境试验;仪器工艺;设备配置;通信设备;环境条件;环境;电信;电信;耐力;试验;试验;极限(数学);分类
【英文主题词】:Classification;Climatictests;Communicationequipment;Deviceconfiguration;Electricalengineering;Environment;Environmentalconditions;Environmentaleffects;Environmentaltesting;Instrumenttechnology;Instruments;Limits(mathematics);Resistance;Telecommunication;Telecommunications;Testing;Tests;Transport
【摘要】:
【中国标准分类号】:M04
【国际标准分类号】:33_050_01
【页数】:1P.;A4
【正文语种】:英语


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【英文标准名称】:Insulationco-ordination-Part1:Definitions,principlesandrules
【原文标准名称】:绝缘配合.第1部分:定义,原理和规则
【标准号】:IEC60071-1Edition8.1-2011
【标准状态】:现行
【国别】:国际
【发布日期】:2011-03
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC28
【标准类型】:()
【标准水平】:()
【中文主题词】:交流电压;配合;定义(术语);介质;接地漏电;接地;导电体;配电;电气的;电气工程;电绝缘材料;电绝缘;电气测试;电驱动装置;装备;高电压;绝缘的;绝缘配合;绝缘水平;绝缘;雷电突波电压;方法;网络;过电压;过电压保护装置;设备;原则;合格试验;额定绝缘等级;额定耐受电压;选择;自体愈合;设备电压;统计;电涌放电器;切换电压;试验;三相电流;三相电力网;变压器;电压;耐电压
【英文主题词】:Alternatingvoltages;Co-ordination;Definitions;Dielectric;Earthleakage;Earthing;Electricconductors;Electricpowerdistribution;Electrical;Electricalengineering;Electricalinsulatingmaterials;Electricalinsulation;Electricaltesting;Electrically-operateddevices;Equipment;Highvoltage;Insulated;Insulationcoordination;Insulationlevels;Insulations;Lightningsurgevoltages;Methods;Network;Overvoltage;Overvoltageprotection;Plant;Principles;Qualificationtests;Ratedinsulationlevel;Ratedwithstandvoltage;Selection;Selfhealing;Servicevoltage;Statistical;Surgearresters;Switchingvoltage;Testing;Three-phasecurrent;Three-phasenetworks;Transformers;Voltage;Withstandvoltage
【摘要】:
【中国标准分类号】:K04
【国际标准分类号】:01_040_29;29_080_30
【页数】:74P;A4
【正文语种】:英语


【英文标准名称】:StandardGuideforNeutronIrradiationofUnbiasedElectronicComponents
【原文标准名称】:未加偏压的电子元件的中子照射标准指南
【标准号】:ASTMF1190-1999(2005)
【标准状态】:现行
【国别】:
【发布日期】:1999
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Practice)
【标准水平】:()
【中文主题词】:辐照;电子设备及元件;电气工程
【英文主题词】:dosimetry;electroniccomponent;equivalentmonoenergeticneutronfluence;fastburstreactor(FBR);galliumarsenide;gammadose;gammaeffects;irradiation;neutronfluence;neutronflux;nickel;1MeVequivalentfluence;radiation;reactor;
【摘要】:Semiconductordevicesarepermanentlydamagedbyreactorspectrumneutrons.Theeffectofsuchdamageontheperformanceofanelectroniccomponentcanbedeterminedbymeasuringthecomponentelectricalcharacteristicsbeforeandafterexposuretofastneutronsintheneutronfluencerangeofinterest.Theresultingdatacanbeutilizedinthedesignofelectroniccircuitsthataretolerantofthedegradationexhibitedbythatcomponent.Thisguideprovidesamethodbywhichtheexposureofsiliconandgalliumarsenidesemiconductordevicestoneutronirradiationmaybeperformedinamannerthatisrepeatableandwhichwillallowcomparisontobemadeofdatatakenatdifferentfacilities.Forsemiconductorsotherthansiliconandgalliumarsenide,thisguideprovidesamethodthatcanimproveconsistencyinthemeasurementsandassurancethatdatafromvariousfacilitiescanbecomparedonthesameequivalencefluencescalewhentheapplicablevalidated1-MeVdamagefunctionsarecodifiedinNationalstandards.Intheabsenceofavalidated1-MeVdamagefunction,thenon-ionizingenergyloss(NIEL)asafunctionincidentneutronenergy,normalizedtotheNIELat1MeV,maybeusedasanapproximation.SeePracticeE722foradescriptionofthemethod.1.1Thisguidestrictlyappliesonlytotheexposureofunbiasedsilicon(SI)orgalliumarsenide(GaAs)semiconductorcomponents(integratedcircuits,transistors,anddiodes)toneutronradiationfromanuclearreactorsourcetodeterminethepermanentdamageinthecomponents.Validated1-MeVdamagefunctionscodifiedinNationalStandardsarenotcurrentlyavailableforothersemiconductormaterials.1.2Elementsofthisguidewiththedeviationsnotedmayalsobeapplicabletotheexposureofsemiconductorscomprisedofothermaterialsexceptthatvalidated1-MeVdamagefunctionscodifiedinNationalstandardsarenotcurrentlyavailable.1.3Onlytheconditionsofexposureareaddressedinthisguide.Theeffectsofradiationonthetestsampleshouldbedeterminedusingappropriateelectricaltestmethods.1.4Thisguideaddressesthoseissuesandconcernspertainingtoirradiationswithreactorspectrumneutrons.1.5Systemandsubsystemexposuresandtestmethodsarenotincludedinthisguide.1.6Thisguideisapplicabletoirradiationsconductedwiththereactoroperatingineitherthepulsedorsteady-statemode.Therangeofinterestforneutronfluenceindisplacementdamagesemiconductortestingrangefromapproximately109to1016n/cm2.1.7Thisguidedoesnotaddressneutron-inducedsingleormultipleneutroneventeffectsortransientannealing.1.8ThisguideprovidesanalternativetoTestMethod1017.3,NeutronDisplacementTesting,acomponentofMIL-STD-883andMIL-STD-750.TheDepartmentofDefensehasrestricteduseoftheseMIL-STDstoprogramsexistingin1995andearlier.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L10
【国际标准分类号】:31_020;31_080_01
【页数】:5P.;A4
【正文语种】: